Comprehensive suite of tools designed for precision manufacturing analytics
Real-time data processing with advanced statistical analysis
Comprehensive yield tracking across wafer lots, process steps, and equipment. Identify patterns and correlations with advanced statistical modeling.
Continuous monitoring of critical parameters with sub-second latency. Instant detection of anomalies and out-of-spec conditions.
Machine learning algorithms identify subtle process drift patterns before they impact yield, enabling proactive intervention.
Automated correlation analysis links process variations to yield impacts, accelerating problem resolution time.
Seamless integration with existing manufacturing systems
Native integration with major MES, ERP, and equipment systems. Support for SECS/GEM, OPC-UA, and custom protocols.
Deploy on-premise, in the cloud, or hybrid. Automatic data synchronization and failover protection.
Comprehensive API for custom integrations. Python, Java, and JavaScript SDKs with extensive documentation.
SOC 2 Type II certified with AES-256 encryption. Role-based access control and audit logging.
Transform data into actionable insights with powerful visualization
Customizable dashboards with drag-and-drop widgets. Real-time charts, heatmaps, and trend analysis.
Schedule reports with custom frequency. Export to PDF, Excel, or direct email distribution.
Natural language query interface. Automated insight generation with narrative explanations.
Advanced wafer mapping with defect clustering and spatial analysis. Support for 300mm and 200mm wafers.
See how PhotonSync can transform your manufacturing operations with a personalized demo
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